【预订】Scanning Probe Microscopy: Characterization, Nanofabrica 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9781402030185 Author 作者 Vilarinho Format 版本 平装-胶订 Pages Number 页数 488页 Publisher 出版社 Springer Netherlands Publication Date 出版日期 2005-02-21 Product Dimensions 商品尺寸 9.2 x 6.1 x 1 cm Shipping Weight 商品重量 1610g Language 语种 英语 Book Contents 内容简介 As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular ma
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【预订】Scanning Probe Microscopy in Nanoscience and Nanotechnol 美国库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783662507254 Author 作者 Bharat Bhushan Format 版本 平装-胶订 Pages Number 页数 630页 Publisher 出版社 Springer Berlin Heidelberg Publication Date 出版日期 2016-08-23 Product Dimensions 商品尺寸 9.2 x 6.1 x 1.3 cm Shipping Weight 商品重量 985g Language 语种 英语 Book Contents 内容简介 This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application sci
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【预订】Scanning Probe Microscopy: Characterization 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy And Spectroscopy: Theory 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy and Spectroscopy: Methods 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy of Soft Matter - Fundamentals 美国库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783527327430 Author 作者 Vladimir Tsukruk Format 版本 精装 Pages Number 页数 661页 Publisher 出版社 Wiley-VCH Publication Date 出版日期 2011-11-16 Shipping Weight 商品重量 1350g Language 语种 英语 Book Contents 内容简介 Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can
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【预订】Scanning Probe Microscopy of Functional Materials 978144 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9781441965677 Author 作者 Kalinin Format 版本 精装 Pages Number 页数 555页 Publisher 出版社 Springer New York Publication Date 出版日期 2010-12-10 Shipping Weight 商品重量 1021g Language 语种 英语 Book Contents 内容简介 The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Exa
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【预订】Scanning Probe Microscopy in Nanoscience and 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy in Nanoscience and Nanotechnol 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783642104961 Author 作者 Bhushan Format 版本 精装 Pages Number 页数 816页 Publisher 出版社 Springer Berlin Heidelberg Publication Date 出版日期 2011-01-10 Shipping Weight 商品重量 1421g Language 语种 英语 Book Contents 内容简介 This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide
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【预订】Scanning Probe Microscopy and Spectroscopy: Methods and 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy 9783540431800 美国库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783540431800 Author 作者 Meyer Format 版本 精装 Pages Number 页数 210页 Publication Date 出版日期 2003-08-27 Language 语种 英语 Book Contents 内容简介 Two decades after its invention, scanning probe microscopy has become a widely used method in laboratories as diverse as industrial magnetic stor? age development or structural biology. Consequently, the community of users ranges from biologists and medical researchers to physicists and engineers, all of them exploiting the unrivalled resolution and profiting from the relative simplicity of the experimental implementation. In recent years the authors have taught numerous courses on scanning probe microscopy, normally in combination with hands-on student experi? ments. The audiences ranged from physics freshmen to biology post-docs and even high-school teachers. We found it of particular importance to cover not only the physical
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【预订】Scanning Probe Microscopy 9783540638155 美国库房发货，通常付款后3-5周到货！
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【预售 按需印刷】Scanning Probe Microscopy of InAs/InP Nan 北京发货，付款后10天内发货
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【预订】Scanning Probe Microscopy 9783662452394 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy: Atomic Force Microscopy and S 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy in Nanoscience and Nanotechnol 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783662506011 Author 作者 Bharat Bhushan Format 版本 平装-胶订 Pages Number 页数 816页 Publisher 出版社 Springer Berlin Heidelberg Publication Date 出版日期 2016-08-23 Product Dimensions 商品尺寸 9.2 x 6.1 x 1.6 cm Shipping Weight 商品重量 1270g Language 语种 英语 Book Contents 内容简介 This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application sc
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【预订】Scanning Probe Microscopy 9783030370916 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783030370916 Author 作者 Meyer Ernst Format 版本 平装-胶订 Pages Number 页数 322页 Publisher 出版社 Springer Berlin Heidelberg Publication Date 出版日期 2022-06-01 Product Dimensions 商品尺寸 9.21 x 6.14 x 0.70 Shipping Weight 商品重量 1.04 Language 语种 其它（含多语） Book Contents 内容简介 Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes wit
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【预订】Scanning Probe Microscopy 9783030370886 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783030370886 Author 作者 Meyer Ernst Format 版本 精装 Pages Number 页数 353页 Publisher 出版社 Springer Berlin Heidelberg Publication Date 出版日期 2021-07-24 Language 语种 其它（含多语） Book Contents 内容简介 Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques
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【预订】Scanning Probe Microscopy for Industrial Applications: N 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy 9783642083600 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783642083600 Author 作者 Wiesendanger Format 版本 平装-胶订 Pages Number 页数 216页 Publisher 出版社 Springer Berlin Heidelberg Publication Date 出版日期 2010-12-15 Language 语种 英语 Book Contents 内容简介 Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
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【预订】Scanning Probe Microscopy in Nanoscience and Nanotechnol 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783662502204 Author 作者 Bharat Bhushan Format 版本 平装-胶订 Pages Number 页数 956页 Publisher 出版社 Springer Berlin Heidelberg Publication Date 出版日期 2016-08-23 Product Dimensions 商品尺寸 9.2 x 6.1 x 1.9 cm Shipping Weight 商品重量 1484g Language 语种 英语
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【预售 按需印刷】Scanning Probe Microscopy for Energy Rese
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【预订】Scanning Probe Microscopy-Physical Property Characteriza 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9789535105763 Format 版本 精装 Pages Number 页数 242页 Publisher 出版社 Intech Publication Date 出版日期 2012-01-01 Language 语种 其它（含多语） Book Contents 内容简介 Scanning probe microscopy SPM is one the key enabling tools for the advancement of nanotechnology, with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, to oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics c
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【预订】Scanning Probe Microscopy: Electrical and 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy: Atomic Scale Engineering 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy for Energy Research 9789814434 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy 9789814324762 美国库房发货，通常付款后3-5周到货！
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【中商原版】Scanning Probe Microscopy Of Soft Matter 材料科学VladimirTsukruk
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【预订】Scanning Probe Microscopy of Functional Materials: Nanos 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy: Atomic Scale Engineering by F 美国库房发货，通常付款后3-5周到货！
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【预订】Scanning Probe Microscopy 9781493950362 国外库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9781493950362 Author 作者 Sergei V. Kalinin Oak Ridge National Laboratory Oak Ridge Format 版本 平装-胶订 Pages Number 页数 980页 Publisher 出版社 Springer New York Publication Date 出版日期 2016-11-04 Language 语种 英语 Book Contents 内容简介 Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on
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【预订】Scanning Probe Microscopy in Nanoscience and Nanotechnol 美国库房发货，通常付款后3-5周到货！
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预订Scanning Probe Microscopy:The Lab on a Tip 预订，预计下单后3-6周左右发货！
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海外直订Scanning Probe Microscopy: Analytical Methods 扫描探针显微镜：分析
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海外直订Scanning Probe Microscopy and Spectroscopy: Methods and
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