【预订】Surface And Thin Film Analysis 2E - A Compendium Of Prin 美国库房发货，通常付款后3-5周到货！
Product Details 基本信息 ISBN-13 书号 9783527320479 Author 作者 Gernot Friedbacher Format 版本 精装 Pages Number 页数 558页 Publisher 出版社 Wiley-VCH Publication Date 出版日期 2011-04-20 Shipping Weight 商品重量 1170g Language 语种 英语 Book Contents 内容简介 Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP), and sum frequency generation (SFG). Appendices with a summary and comparison of techni
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3-6周达 高被引Surface And Thin Film Analysis 2E - A Compendium Of 【全球购】进口原版图书，预计3-6周左右到国内
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